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Browsing by Author "Macdonald, D."

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PreviewIssue DateTitleAuthor(s)
comment.pdf.jpg19-May-2004 Comment on “Mechanisms for the anomalous dependence of carrier lifetime on injection level and photoconductance on light intensity” [J. Appl. Phys. 89, 332 (2001)]Macdonald, D.; Cuevas, A.
Osaka-Fe-paper-with-header.pdf.jpg19-May-2004 Getting and poisoning of silicon wafers by phosphorus diffused layersMacdonald, D.; Cheung, A.; Cuevas, A.
nrelCu.pdf.jpg19-May-2004 Influence of copper on the carrier lifetime of n-type and p-type siliconStewart, K.; Cuevas, A.; Macdonald, D.; Williams, J.
2AO_2_3.PDF.jpg27-Mar-2006 Influence of reactive ion etching on the minority carrier lifetime in P-type SiDeenapanray, P.N.K.; Athukorala, C.S.; Macdonald, D.; Everett, V.E.; Webber, K.J.; Blakers, A.W.
NREL2002.pdf.jpg19-May-2004 Injection-dependent lifetime studies of copper precipitates in siliconMacdonald, D.; Brendle, W.; Cuevas, A.; Istratov, A.A.
nrelFeB.pdf.jpg19-May-2004 Lifetime spectroscopy of FeB pairs in siliconMacdonald, D.; Cuevas, A.
sims.pdf.jpg19-May-2004 Metallic impurities in multicrystalline siliconMacdonald, D.; Cuevas, A.
biasJAP.pdf.jpg19-May-2004 On the use of a bias-light correction for trapping effects in photoconductance-based lifetime measurements of siliconMacdonald, D.; Sinton, R.A.; Cuevas, A.
IEEE-with-header.pdf.jpg19-May-2004 Phosphorus gettering in multicrystalline silicon studied by neutron activation analysisMacdonald, D.; Cuevas, A.; Kinomura, A.; Nakano, Y.
Macdonald-1P-C3-05.pdf.jpg19-May-2004 Temperature and injection-dependent lifetime spectroscopy of copper-related defects siliconMacdonald, D.; Cuevas, A.; Rein, S.; Lichtner, P.; Glunz, S.W.
SRH-PRB-two-col.pdf.jpg19-May-2004 Validity of Shockley-Read-Hall statistics for modeling carrier lifetimes in siliconMacdonald, D.; Cuevas, A.
Showing results 1 to 11 of 11

 

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