Demetrius
The AUSTRALIAN NATIONAL UNIVERSITY
Search DSpace
Advanced Search
Home
Browse
Communities
& Collections
Issue Date
Author
Title
Subject
Sign on to:
Receive email
updates
My DSpace
authorized users
Edit Profile
Help
About DSpace
Demetrius at The Australian National University
>
Browsing by Author "Macdonald, D."
Jump to:
0-9
A
B
C
D
E
F
G
H
I
J
K
L
M
N
O
P
Q
R
S
T
U
V
W
X
Y
Z
or enter first few letters:
Sort by:
title
issue date
submit date
In order:
Ascending
Descending
Results/Page
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
Authors/Record:
All
1
5
10
15
20
25
30
35
40
45
50
Showing results 1 to 11 of 11
Preview
Issue Date
Title
Author(s)
19-May-2004
Comment on “Mechanisms for the anomalous dependence of carrier lifetime on injection level and photoconductance on light intensity” [J. Appl. Phys. 89, 332 (2001)]
Macdonald, D.
;
Cuevas, A.
19-May-2004
Getting and poisoning of silicon wafers by phosphorus diffused layers
Macdonald, D.
;
Cheung, A.
;
Cuevas, A.
19-May-2004
Influence of copper on the carrier lifetime of n-type and p-type silicon
Stewart, K.
;
Cuevas, A.
;
Macdonald, D.
;
Williams, J.
27-Mar-2006
Influence of reactive ion etching on the minority carrier lifetime in P-type Si
Deenapanray, P.N.K.
;
Athukorala, C.S.
;
Macdonald, D.
;
Everett, V.E.
;
Webber, K.J.
;
Blakers, A.W.
19-May-2004
Injection-dependent lifetime studies of copper precipitates in silicon
Macdonald, D.
;
Brendle, W.
;
Cuevas, A.
;
Istratov, A.A.
19-May-2004
Lifetime spectroscopy of FeB pairs in silicon
Macdonald, D.
;
Cuevas, A.
19-May-2004
Metallic impurities in multicrystalline silicon
Macdonald, D.
;
Cuevas, A.
19-May-2004
On the use of a bias-light correction for trapping effects in photoconductance-based lifetime measurements of silicon
Macdonald, D.
;
Sinton, R.A.
;
Cuevas, A.
19-May-2004
Phosphorus gettering in multicrystalline silicon studied by neutron activation analysis
Macdonald, D.
;
Cuevas, A.
;
Kinomura, A.
;
Nakano, Y.
19-May-2004
Temperature and injection-dependent lifetime spectroscopy of copper-related defects silicon
Macdonald, D.
;
Cuevas, A.
;
Rein, S.
;
Lichtner, P.
;
Glunz, S.W.
19-May-2004
Validity of Shockley-Read-Hall statistics for modeling carrier lifetimes in silicon
Macdonald, D.
;
Cuevas, A.
Showing results 1 to 11 of 11
Repository Service Operated by
Division of Information
,
The Australian National University
Powered by
DSpace Software
Copyright © 2002-2006
MIT
and
Hewlett-Packard
-
Feedback